教員紹介

論文

• Analysis of Multicrystalline Si Solar Cell Improvement Using Laser-Beam-Induced Current Technique 2024/06/22

• Suppression of PBTI of SiC-MOSFETs Under 100 kHz Gate-Switching Operation by Using a Gate Off-Voltage of -5 V 2018/06/05

• Interior and Surface Degradation Analysis of Multicrystalline Si Solar Cell Module Using Laser-Beam-Induced Current Technique 2018/03

• Positive bias temperature instability of SiC-MOSFETs induced by gate-switching operation 2017/03/15

• Special features of Fowler-Nordheim stress degradation of SiC-MOSFETs 2016/03/08

• Interior degradation analysis of distributed feedback laser using optical-beam-induced current 2014/12

• Long-term degradation behavior of 2.3-μm wavelength highly strained InAs/InP MQW-DFB lasers with p-/n-InP buried heterostructure 2012/04

• Analysis of main degradation in lasers with p-/n-type InP buried layers using OBIC technique 2012/03

• Failure analysis using optical evaluation technique (OBIC) of LDs for fiber optical communication 2010/06

• Degradation analysis of InP buried heterostructure layers in lasers using optical beam induced current technique 2010/03

• Reliable 2.3-μm wavelength highly strained InAs/InP MQW-DFB lasers with p-/n-InP buried heterostructure 2009/07

• Highly stable 1.3 μm wavelength lasers with p- and n-InP buried heterostructures 2008/09

• Optical-beam-induce current analysis of wear-out degradation in high-reliability Fabry-Perot diodes for access networks 2008/06